Infrared and Raman spectroscopic analysis of functionalized graphene

In this mini-review, we discuss our work in the analysis of material properties electrochemically functionalized graphene using infrared (IR) and Raman techniques as thin film sensitive vibrational spectroscopies. Multiscale characterization is demonstrated a combination IR spectroscopic ellipsometry (IRSE), confocal spectroscopy (RS) photothermal atomic force microscopy coupled (AFM-IR). IRSE used for spots with dimensions few mm, RS diameter micrometer AFM-IR at sub-100 nm scale. first part article, large-area sheets modified by ultrathin oligomer films maleimidophenyl or 4-aminophenyl acetic acid are studied. Characteristic molecular vibrations functional layers analyzed methods, while graphene-related phonons characterized RS. This dual approach allowed determination attached groups well identification nature chemical coupling moieties to graphene. The thickness deposited extracted from data correlates very AFM measurements. second correlative optical directly device level.